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Main page > Data Analysis and Forensic Tools > Data/Code read services > X-ray / Laminography / CT for microSD, SD, UFD cards > X-ray service of micro SD, SD, UFD cards
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X-ray service of micro SD, SD, UFD cards
X-ray service of micro SD, SD, UFD cards is a service dedicated to research laboratories that enables insight into internal copper layers in order to identify pinouts, interrupts, and short circuits during data recovery. This method is used especially in cases where the first copper layer is a full monolith block (without the NAND process signal leads) and all leads are in the second or third layer .
Sample photo of the first and second copper layers (SanDisk 3x7 card):
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